|
|
 |
| Research
Areas
|
 |
Electromagnetics—fundamental
microwave quantities, high-speed microelectronics, electromagnetic
compatibility, antennas, and electromagnetic properties of materials,
and advanced measurement methods and standards for the magnetic data
storage and superconductor power industries. |
|
Materials
reliability—measurement
methods and standards enhancing the quality and reliability of materials. |
|
Mathematical
and computational sciences—design
of experiments, modeling, analytical methods, and algorithms for science. |
|
Optoelectronics—measurement
technology, standards, and traceability for the optoelectronic industry. |
|
Physical
and chemical properties—measurements,
standards, data, and models for the thermophysical/chemical properties
of gases, liquids, and solids and for low-temperature refrigeration
systems. |
|
Quantum
devices—advances
measurement science in a variety of fields using state-of-the-art
science and technology, especially; quantum effects, including superconductivity,
low temperatures to reduce thermal noise, and state-of-the-art lithography
to achieve small sizes. |
|
Quantum
physics—atomic
and chemical physics, precision measurement, and laser and optical
physics. |
|
Statistical
modeling and analysis—modern
statistical experimental design, statistical modeling, data analysis,
and process control procedures. |
|
Time
and frequency—standards
of time and frequency; dissemination of timing information using radio
broadcasts and the Internet. |
| |
| |
Privacy
policy/ security notice / accessibility statement
Disclaimer
/ FOIA /
No
Fear Act Policy
Date created:
February 23, 2001
Last updated:
September 03, 2008
Contact: inquiries@nist.gov |
|
|
|
 Check
NIST Time
Frequently
asked questions about time
|
|
NIST News: 
In-depth look: An image of gold atoms on tin from a state-of-the-art scanning electron microscope (left) has relatively poor depth of field–only parts of the image are in sharp focus. By contrast, the entire image from a helium ion microscope image (right) is sharp and clear. NIST researchers are studying helium ion microscopes to improve measurements at the nanoscale that are important to the semiconductor and nanomanufacturing industries. Read more.
|
|
