Steven Ehrlich Physicist Steven Ehrlich is the Experimental Operations Manager and User Liaison for the NSLS. He coordinates operations with internal and external research groups and facility users, troubleshoots operational problems at beamlines, runs the weekly X-ray/VUV User Meeting, and creates and distributes weekly User Meeting minutes. He also provides NSLS experimental users an interface with machine operations and NSLS and BNL staff. Steven is also the spokesperson and local contact for beamline X18A. His research interests include structural changes of noble gases in confined media and synchrotron instrumentation. Professional Activities

Phone: 344-7862 Fax: 631-344-3238 Email: ehrlich@bnl.gov

Education

• Ph.D. 1986: Physics, University of Illinois at Urbana-Champaign
• M.S. 1979: Physics, University of Illinois at Urbana-Champaign
• B.S. 1977: Physics, Rensselaer Polytechnic Institute
• B.S. 1977: Mathematics, Rensselaer Polytechnic Institute

Projects

• X-ray specular reflectivity studies of long alkane films adsorbed on a SiO[SUB]2[/SUB] surface
• Structure and growth of dotriacontane films on SiO[SUB]2[/SUB] and Ag(111) surfaces

Key Publications

• S Chattopadhyay, A Uysa, B Stripe, G Evmenenko, S Ehrlich, E Karapetrova, P Dutta, Structural Signal of a Dynamic Glass Transition, Phys. Rev. Lett., 103, 175701 (2009).
• M Bai, K Knorr, M Simpson, S Trogisch, H Taub, S Ehrlich, H Mo, U Volkmann, F Hansen, Nanoscale Observation of Delayering in Alkane Films, Europhys. Lett., 79, 26003-p1 (2007).
• H Mo, S Trogisch, H Taub, S Ehrlich, U Volkmann, F Hansen, M Pino, Studies of the Structure and Growth Mode of Dotriacontane Films by Synchroton X-ray Scattering and Molecular Dynamics Simulations, J. Phys.: Condens. Matter, 16, S2905 (2004).
• Y Zhang, S Ehrlich, R Colella, M Kopecky, M Widom, X-ray Diffuse Scattering in Icosahedral Quasicrystal Al-Pd-Mn, Phys. Rev. B: Condens. Matter, 66, 104202 (2002).
• D Silva, P Sokol, S Ehrlich, Mobility Transition of Solid Rare Gases in Confined Environments, Phys. Rev. Lett., 88(15), 155701-1 (2002).

All Publications