Research Facilities
Sector 33 Bending Magnet Beamline (technical details) intended to support XAFS, Topography, and General-Purpose Scattering & Diffraction.
Sector 33 Insertion Device Beamline (technical details) designed
and operated for General Purpose Scattering & Diffraction, Ultra-Small
Angle X-ray Scattering, and Surface & Interface Scattering.
Sector 34 Insertion
Device Beamline (technical details) designed for Coherent X-ray Diffraction and for Microbeam Diffraction
applications.
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