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33BM (schedule)
    XAFS
    Topography
    Diffraction

33ID (schedule)
    Bruker
    Kappa diffractometer
    pulsed laser ablation
    surface/interface scattering
    USAXS

34ID (schedule)
    Coherent Diffraction
    Tomography
    Microdiffraction

APS Sector Websites

APS Beamline Information

33BM

Sector 33 Bending Magnet Beamline intended to support XAFS, Topography, and General-Purpose Scattering & Diffraction.

33BM-C 4-circle diffractometer for general purpose scattering
33BM-B topography
33BM-B XAFS

33ID

Sector 33 Insertion Device Beamline designed and operated for General Purpose Scattering & Diffraction, Ultra-Small Angle X-ray Scattering, and Surface & Interface Scattering.

33ID-D Bruker
33ID-D kappa diffractometer
33ID-D pulsed laser ablation
33ID-E surface and interface scattering
33ID-D USAXS & (SB-USAXS)

34ID

Sector 34 Insertion Device Beamline designed for Coherent X-ray Diffraction, Tomography, and Microbeam Diffraction applications.

34ID-C coherent diffraction
34ID-E microbeam diffraction
34ID-C tomography

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This page last modified: 2005-05-18 3:14 PM