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Grazing Incidence X-ray Diffraction (GIXD)
The GIXD mode can be used to determine the lateral organization
at the interface. In particular, if the top layer is organized, then
two-dimensional Bragg reflections can be observed. In GIXD experiments
the incident beam, ki is kept below the critical angle creating an evanescent
wave with finite penetration depth into the bulk of the sample thus enhancing
signals from the surface. An ordered 2D system gives rise to rod
like Bragg reflections that contain information on the electron density
along the z-axis of the ordered objects. The total cross section
for scattering from a 2D system is in general very small and X-ray flux
from synchrotron sources is required.
Prev - X-ray Reflectivity
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